Maximum robustness with no compromise in performance
The trend for increasing complexity of both samples and studies can result in difficulty obtaining high quality data for every component of interest while maintaining optimum performance throughout the analysis.
The Xevo® G2-XS Tof combines StepWaveTM ion optics with the XS Collision Cell, providing a significant increase in sensitivity with no reduction in selectivity. During long analyses, critical hardware components stay clean for longer, so results are more reproducible and the laboratory stays productive.
Meaningful information is obtained for a greater number of components across a larger population of samples than ever before, giving a more complete picture for improved understanding and more confident decision making.