Confidence in what you find
To complement the novel Cyclic Ion Mobility capability and for complete confidence in your data, the SELECT SERIES Cyclic IMS is equipped with the latest TOF technology.
The XS transfer device maintains the fidelity of the ion mobility separation whilst simultaneously conditioning the ion beam for the very best time-of-flight performance. The new offset oa-Tof with dual gain detection system provides improved sensitivity, resolution >100,000 (FWHM), reliable accurate exact mass measurements (low ppm) and improved dynamic range.